講演情報

[16a-W2_401-4]Dependence of 2-dimensional electron gas mobility on temperature and carrier concentration: Evidence of carrier-carrier scattering

〇Markus Pristovsek1, Yoann Robin1, Itsuki Furuhashi1 (1.IMASS, Nagoya Univ.)

キーワード:

mobility、2DEG

III-Nitride-based high electron mobility transistors (HEMTs) have very high sheet carrier densities due to the strong polarization contrast between AlN and GaN. Recently, devices using direct AlN/GaN interfaces have been realized with sheet carrier densities exceeding 8x1013 cm-2 in 10 nm thin channels. However, the temperature-dependent mobility of such high sheet carrier density 2-dimensional electron gases (2DEG) shows a very different behavior than expected. Typically, the temperature-dependent mobility of a 2DEG above 200 K is limited by the optical phonon scattering (µPO) which is characterized by an exp(1/T) dependence. We observed that an additional temperature contribution proportional to 1/T² must be included in the mobility to reproduce our experimental data.
When reviewing the published data of AlGaN/GaN based 2DEGs, we noticed that such a 1/T² contribution is indeed present in most temperature-dependent mobility datasets, more pronounced at higher the sheet carrier densities. Thus, there is a mobility contribution µ~1/(Ns T²) in most 2DEGs. The usual µPO can neither account for the observed temperature dependence, nor for the strong reduction of channel mobility starting around 1.5x1013 cm-2. Hence, we attribute this hitherto unaccounted scattering mechanism to carrier-carrier scattering (probably between different subbands in the 2DEG or including three carrier processes), which ultimately limits the room temperature mobility at very high sheet carrier densities.