Presentation Information
[1A-068-PG]Evaluation method for noise reduction in simultaneous EEG-fMRI measurement using Test-retest reliability of EEG microstate
*Mizuki Tsutsumi1, Toshikazu Kuroda1, Reinmar Kobler1,2, Takeshi Ogawa1, Tomohiko Kishi1, Motoaki Kawanabe1,2 (1. Advanced Telecommunications Research Institute International, 2. RIKEN-AIP)
Keywords:
Simultaneous EEG-fMRI,Test-retest reliability,EEG microstate metrics
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