Presentation Information

[15a-K401-6]Effect of annealing on the performance of N-polar GaN HEMT devices

〇(M1C)Ryosuke Ninoki1, Nobuteru Hirata1, Aina Hiyama Zazuli1, Kai Fujii1, Taisei Kimoto1, Satoshi Kurai1, Narihito Okada1, Youichi Yamada1 (1.Grad. School of Sci. & Tech. for Innovation, Yamaguchi Univ.)

Keywords:

N-polar GaN


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