Presentation Information
[15p-K301-8]Characterization of thermal stability of Te-based contact electrical properties for TMDC MOSFETs
〇WENHSIN CHANG1, S. HATAYAMA1, Y. SAITO1,2, N. OKADA1, T. ENDO3, Y. MIYATA3, T. IRISAWA1 (1.SFRC, AIST, 2.Tohoku Univ., 3.Tokyo Metro. Univ.)
Keywords:
TMDC,MOSFET,thermal stability
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