[15p-K304-1~11] 3.7 Optical measurement, instrumentation, and sensor

3:45 PM - 4:00 PM JST(6:45 AM - 7:00 AM UTC)

[15p-K304-1] Infrared Microscopy Using a Multilayer Graphene Light Source

〇Yuji Higuchi¹, Shingo Norimoto¹, Jun Koshoubu¹, Jumpei Yamada², Toru Asahi³, Hideyuki Maki^2,4 (1.JASCO Corp., 2.Keio Univ., 3.Waseda Univ., 4.Center for Spintronics Research Network, Keio Univ.)

Keywords:

multilayer graphene light source,Infrared microscopy,high sensitivity

Infrared microscopy is often limited by low light utilization efficiency at high spatial resolutions. This is because light from areas surrounding the measurement spot is blocked by a spatial aperture, which reduces the signal. In this study, we developed an infrared microscopy method using a graphene light source. We compared the performance of our graphene light source with a conventional ceramic light source by obtaining the infrared spectra of a polystyrene film and evaluating the signal-to-noise ratio (SNR). Measurements were performed on the same sample area using each light source. The graphene light source showed a 20-fold improvement in SNR.