Session Details
[15p-K304-1~11]3.7 Optical measurement, instrumentation, and sensor
Sat. Mar 15, 2025 3:45 PM - 7:00 PM JST
Sat. Mar 15, 2025 6:45 AM - 10:00 AM UTC
Sat. Mar 15, 2025 6:45 AM - 10:00 AM UTC
K304 (Lecture Hall Bldg.)
Takashi Kato(UEC)
[15p-K304-1]Infrared Microscopy Using a Multilayer Graphene Light Source
〇Yuji Higuchi1, Shingo Norimoto1, Jun Koshoubu1, Jumpei Yamada2, Toru Asahi3, Hideyuki Maki2,4 (1.JASCO Corp., 2.Keio Univ., 3.Waseda Univ., 4.Center for Spintronics Research Network, Keio Univ.)
[15p-K304-2]Probing Gaseous Photothermal Effects using Background-free Vibrational Dispersion Spectroscopy
〇WENQING SONG1, KOKORO FUJIWARA1, IKKI MORICHIKA1, SATOSHI ASHIHARA1 (1.IIS, The Univ. of Tokyo)
[15p-K304-3]Development of chirality detection method using circularly polarized high-order harmonic light source
〇(B)Ryunosuke Oshima1, Ryunosuke Hasegawa1, Yuta Takahashi1, Shinichiro Minemoto2, Sekikawa Taro1 (1.Hokkaido Univ., 2.UTokyo)
[15p-K304-4]Formulation and optimization of a non-Dispersive InfraRed absorption measurement system.
〇sangwoon Park1,2, Masahiko Inoue3 (1.Setsunan Univ. Division of Innovation and Creativity Engineering, 2.HORIBA, ltd., 3.Setsunan Univ. Department of Electrical and Electronics Engineering)
[15p-K304-5]Varieties of Simulating Quantum OCT Signals Classically and Their Properties
〇Tomohiro Shirai1 (1.AIST)
[15p-K304-6]Extending of measurement range for SD-OCT using optical comb
〇(B)Ryo Sato1, Kaining Zhang2, Yasuhiro Kabetani3, Takamasa Suzuki1, Samuel Choi1 (1.Niigata Univ., 2.OPTQUEST CO.,LTD., 3.Panasonic Holdings Corp.)
[15p-K304-7]Study on evaluation between visual characteristics and cosmetic coating morphologically observed by visible-light OCT
〇Mizuki Maeda1, Hattori Akito1, Shibano Yukiko1, Fujioka Masahiro1, Okiyama Natsuko1, Iwai Toshiaki2 (1.Kao corporation, 2.Tokyo Univ. of Agri. & Tech.)
[15p-K304-8]Spectropolarimetric Microscope Using Wavelength-Scanning Source (2)
〇Gaku Tanizaki1, Shintaro Soma1, Xiaoshuai Chen1, Kazuhiko Oka1 (1.Hirosaki Univ.)
[15p-K304-9]High-sensitivity imaging of nanometer-scale surface variations using a centrally apertured wave
〇Keisuke Yoshiki1,2, Norihisa Yoshimura2 (1.Kochi Univ. of Tech., 2.CCS Inc.)
[15p-K304-10]Observation of nano-steps by pupil-segmented polarization imaging camera with ECB LCD
〇Norimasa Tsutsui1,2, Keisuke Yoshiki1, Ikenoue Hiroshi1 (1.D-Future, Research Institute, Kochi Univ. of Tech., 2.Denken Co., Ltd)
[15p-K304-11]High frame rate sound field imaging in under-sampling measurements
〇(M2)Nao Sakiyama1, Naru Yoneda1,2, Yasuhiro Awatsuji3, Osamu Matoba1,2 (1.Kobe Univ., 2.OaSIS, Kobe Univ., 3.Kyoto Inst. of Tech.)