Presentation Information
[15p-P05-34]Direct growth of MoS2 thin films at the Au/SiO2 interface
〇Shota Saruta1, Keiji Ueno1, Hon En Lim1 (1.Saitama Univ.)
Keywords:
Transition metal dichalcogenide,Chemical vapor deposition,Molybdenum disulfide
Molybdenum disulfide (MoS2) has a smooth surface without dangling bonds and functions as a direct-transition semiconductor with a bandgap of approximately 1.8 eV in its monolayer form, making it a subject of active research for device applications. However, many conventional device fabrication methods involve depositing a thin film first and then forming electrodes, raising concerns about performance degradation due to contamination from photoresists and damage during electrode formation. In this study, we aim to directly grow MoS2 thin films on the Au/SiO2 interface to achieve a clean interface and high-quality thin films.
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