Presentation Information

[16a-K101-11]Investigation of plasma-surface reaction mechanism in hexagonal boron nitride crystal growth by microwave PE-CVD

〇Yukihiro Muta1, Masahito Sugiura1, Takashi Matsumoto1 (1.Tokyo Electron Technology Solutions Ltd.)

Keywords:

hexagonal boron nitride,2D material,CFET

We are working on the development of h-BN film deposition technology for the Logic A3 generation 2D material CFET. It has been found that h-BN deposited using N2 as the nitrogen source in this process has better orientation and grain size than that deposited using NH3, but the reason for this remains unclear. Here, we report on the important points for the deposition of highly oriented h-BN films based on the consideration of the reaction mechanism by the analysis of reactive species in the plasma using OES.

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