[16a-K504-1~6] 6.6 Probe Microscopy

10:00 AM - 10:15 AM JST(1:00 AM - 1:15 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[16a-K504-1] Development for detection of work in transient phenomena using atomic force microscope

〇Tomohiro Shigeno¹, Yuuki Yasui¹, Yoshiaki Sugimoto¹ (1.Univ. Tokyo)

Keywords:

atomic force microscope