[16p-K301-1~13] 13.7 Compound and power devices, process technology and characterization

4:30 PM - 4:45 PM JST(7:30 AM - 7:45 AM UTC)

[16p-K301-10] Suppression of bipolar degradation using low-BPD wafers

〇(P)Endong Zhang¹, Haruko Inayoshi², Tomohiko Sugiyama², Kiyoshi Matsushima², Jun Yoshikawa², Masashi Kato¹ (1.NITech, 2.NGK INSULATORS, LTD.)

Keywords:

bipolar degradation