[16p-K301-1~13] 13.7 Compound and power devices, process technology and characterization

3:45 PM - 4:00 PM JST(6:45 AM - 7:00 AM UTC)

[16p-K301-7] Sample thickness dependence of omnidirectional photoluminescence spectra for 4H-SiC epilayers

〇Hayaki Makino¹, Kengo Suzuki², Masashi Kato¹ (1.NITech, 2.Hamamatsu Photonics K.K.)

Keywords:

External quantum efficiency,Omnidirectional photoluminescence