Presentation Information

[16p-K310-4]A method for measuring substrate temperature during MBE growth of GaAsBi

〇Satoshi Shimomura1, Riku Eguchi1, Hiroto Imai1 (1.Ehime Univ.)

Keywords:

MBE,GaAsBi,thermography

A method for measuring substrate temperature using thermography for the growth of GaAsBi is proposed.

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