Presentation Information
[1G03]Recent developments and applications of a high-throughput peak fitting method based on the EM algorithm
*Tarojiro Matsumura1 (1. Research Center for Computational Design of Advanced Functional Materials National Institute of Advanced Industrial Science and Technology (AIST))
A high-throughput spectral analysis method based on the Expectation Maximization (EM) algorithm has been developed. In this presentation, I will provide an overview of a peak fitting approach based on the EM algorithm, focusing on both its theoretical foundation and practical applications in high-throughput analysis. I will also introduce our ongoing efforts to develop an accelerated and automated version, designed for integration with database servers and remote sensing platforms. This system automatically detects and analyzes spectral data stored in designated directories, leveraging parallel processing to achieve rapid and scalable performance.