Presentation Information
[1P21]Simulated scan path dependence of stick-slip transition in atomic- force microscopy
*Shun Seo1, Naruo Sasaki1 (1. Graduate School of Informatics and Engineering, The University of Electro-Communications)
We study simulates the scan path dependence of the stick-slip transition in AFM using a 3D Tomlinson model with a Steele force field potential to clarify the critical lateral spring constant (kc). For scan paths with rotation centered at the origin, kc is nearly constant across all scan directions, showing no directional dependence. However, for paths with translational components, kc varies with translational position, indicating a dependence on translational position and the coexistence of frictional and conservative force regions. Paths over hollow sites show typical stick-slip, while paths not over them exhibit various sliding behaviors and stochastic fluctuations. This work simulated kc for arbitrary AFM scan paths, finding rotational symmetry for paths over hollow sites and marked scan directional dependence for paths not over hollow sites. Future work will discuss more complex surface structures and multiple-atom tips to predict and control realistic frictional phenomena.