Presentation Information
[2P16]Physical and chemical analysis of carbon black surfaces using scanning probe microscopy
*Yuto Ariyoshi1, Mari Isagoda1, Takayuki Aoki2, Ayano Itagaki2, Tomoko K Shimizu1 (1. Keio University, 2. Asahi Carbon Corporation)
This study characterized the physical and chemical properties of two carbon black (CB) samples, Asahi Thermal (AT) and Sun Black 960 (SB), using advanced microscopy and spectroscopy. Atomic Force Microscopy (AFM) revealed differences in the aggregate shape and size between the two samples. Fourier Transform Infrared (FTIR) spectroscopy identified oxygen-containing functional groups. Nano-FTIR analysis revealed the correlation between the structure and the existing functional groups for each aggregate. The results demonstrate that combining these advanced analytical techniques is a powerful method for characterizing complex carbon materials like CB, providing useful insights for industrial applications.