Presentation Information
[2P20]Corrosion Behavior of AlCoCrFeNi HEA in Sulfuric Acid via Hard and Soft XPS
*Wei-Chun Lin1,2, Pei-Chen Huang2 (1. Taiwan Vacuum Society, 2. Department of Photonics, National Sun Yat-sen University)
Owing to the stronger X-ray energy of the HAXPES, the overlap of Auger signals in spectra can be prevented, thus leading to a highly authentic elemental composition study and revelation of deeper elemental distributions. In addition, the distribution of each element can be proven by comparing the compositions obtained by XPS and HAXPES. Strong reactions between AlCoCrFeNi HEAs and sulfuric acid with different dissolution behaviors were observed. From XPS and HAXPES, the atomic ratios of Al and Cr compounds decreased after immersion for 1 day and increased greatly after long-term immersion, suggesting redeposition of these two elements on the HEA surface. In contrast, the atomic ratios of Fe, Co, and Ni initially increased and then decreased. With the evidence from ICP–MS, it could be proven that Fe, Co, and Ni keep dissolving into solution until ample redeposition of Al and Cr compounds occurred.