Presentation Information
[2P24]Tip-oscillation synchronized detection of infrared spectra using frequency modulation atomic force microscopy
*Toyoko Arai1,2, Nobuhiko Utsunomiya1, Yuta Okabe1, Masahiko Tomitori2 (1. Graduate School of Natural Science and Technology, Kanazawa University, 2. School of Materials Science, Japan Advanced Institute of Science and Technology)
Infrared spectroscopy (IR), such as optical vibrational spectroscopy and Raman spectroscopy, is remarkably powerful in analyzing the chemical compositions utilizing the vast IR database. However, its spatial resolution is limited to 3–10 µm due to its optical wavelength. Meanwhile, the atomic force microscopy (AFM) has significantly better resolution, although its chemical analysis capabilities are limited. Thus, we develop an infrared spectroscopy method based on frequency modulation (FM)-AFM to achieve higher spatial resolution in non-contact mode, which we refer to as tip-oscillation synchronized detection of infrared spectroscopy (TS-IR).