Presentation Information
[2P26]Analysis of interfacial changes at the epoxy/silver interface induced by long-term annealing using simulations
*Kotaro Katsumori1, Misaki Ikeda1, Takayuki Miyamae1, Masaya Ukita2, Keisuke Wakamoto2 (1. Graduate School of Science and Engineering, Chiba University, 2. ROHM R&D Center)
Simulation of SFG spectra at the epoxy/silver interfaces has clarified the interfacial changes that occur during long-term annealing. Based on the three-layer model, the SFG peak reversal and the decrease in signal intensities were reproduced when the Ag2O layer thickness between the epoxy and silver layers exceeded 18 nm. These results indicate that long-term annealing leads to the growth of the Ag2O layer at the epoxy/silver interface.