Presentation Information
[2P28]Development of field ion microscope with a system using the objective detection model to acquire atomic position in samples toward data mining
*Jiayu Li1, Takumi Seko1, Tatsuo Iwata1, Shigekazu Nagai1 (1. Graduate School of Engineering, Mie University)
Field ion microscopy (FIM) can be used to observe the surface atomic arrangements of needle metal samples with a high spatial resolution, which can identify crystalline structures and find lattice defects. To obtain information on these, it is necessary to efficiently acquire vast FIM images in depth of the specimen during the field evaporation. In this study, we developed a field ion microscope with a system using an objective detection model to detect the positions of field-evaporated atoms in the FIM image and control field evaporation events by automatically adjusting the applied voltage. Using this system to observe FIM samples, the positions of atoms specific volume consisting of 13 layers of the (111) plane can be extracted almost completely. Reconstruction of these atomic positions was performed using simple stacking algorithms along the (111) orientation, the estimated interplanar distance between the (110) planes was within 15% of that of the ideal BCC structure of W.