Presentation Information
[3C06]Microspectroscopic measurements and analysis using photoelectron momentum microscopy: A study concerning the azimuthal orientation distribution of CVD Graphene
*shin-ichiro tanaka1, Shigemasa Suga1, Yuki Somei2, Yusuke Sato2, Fumihiko Matsui2, Itsuki Imahori3, Yoshihide Aoyagi3, Shinya Ohno3 (1. SANKEN, The University of Osaka, 2. UVSOR, IMS, 3. Grad. Sch. Eng. Sci., Yokohama Nat'l Univ)
Recent advances in electron spectroscopy and microscopy have created large datasets requiring advanced AI-based analysis techniques. This study combines photoelectron momentum microscopy (PMM) with newly developed Python-based analysis programs utilizing the PyTorch framework to determine the azimuthal orientation of chemical vapor deposition (CVD) graphene. Using microscopic ARPES at UVSOR Synchrotron (IMS), clear $\pi$-oriented valence bands were observed, indicating different graphene domain orientations. Simulations optimized via gradient descent achieved good agreement with experimental data. Spatial mapping revealed distinct orientation patterns, and statistical analysis indicated a bimodal distribution, described by two Gaussian components reflecting highly oriented and structurally varied regions. These results were validated through comparative photoemission electron microscopy (PEEM) measurements. Detailed discussions will be provided.