Presentation Information
[3E07]Measurement of work at one oscillation cycle using atomic force microscope
*Tomohiro Shigeno1, Yuuki Yasui1, Yoshiaki Sugimoto1 (1. Graduate School of Frontier Sciences, The University of Tokyo)
Although an atomic force microscope (AFM) manipulates atoms on a surface by doing work on the atoms, there is no established method for measuring this work. One potential method is to measure the hysteresis in the force curve. However, the accuracy of this method is questionable because it uses data from multiple oscillations and does not directly detect the work done by a single oscillation cycle. We are developing a method to measure the work done by one oscillation cycle using a frequency-modulation atomic force microscope with constant excitation (CE-AFM). We tested this method by applying bias pulses between the tip and the sample and successfully detected the work done by the bias pulses through an amplitude change. Using the amplitude data, we calculated the energy and compared it with the hysteresis in the force curve.