Presentation Information
[3E15]Nanoscale Characterization of Patterned LaAlO3/SrTiO3 Interface via NC-AFM
*Dilek YILDIZ1,2, Dengyu Yang3,4, Muqing Yu3,4, Sungmin Kim1,2, En-Min Shih1,5, Steven R. Blankenship1, Patrick Irvin3,4, Nikolai B. Zhitenev1, Jeremy Levy3,4, Joseph A. Stroscio1 (1. Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA , 2. Joint Quantum Institute, Department of Physics, University of Maryland, College Park, MD, 20742, USA , 3. Department of Physics and Astronomy, University of Pittsburgh, Pittsburgh, PA 15260, USA, 4. Pittsburgh Quantum Institute, Pittsburgh, PA, 15260, USA , 5. Department of Chemistry and Biochemistry, University of Maryland, College Park, MD, 20742, USA)
In this study, we used scanning probe microscopy techniques, including non⁃contact AFM and Kelvin probe force microscopy, to investigate conductive nanostructures buried at the LaAlO3⁄SrTiO3 (LAO⁄STO) interface. By imaging variations in surface potential and energy dissipation, we show spatial differences between conducting and insulating regions, resulting from the 2D electron gas at the interface. These results highlight the sensitivity of SPM to electrostatic and structural features, offering valuable insight into the electronic behavior in oxide heterostructures.