Presentation Information
[3G06]Tracking of amorphous network evolution under surface-activation by highly sensitive time-resolved coherent Raman spectroscopy
*Keisuke Seto1, Ryu Yoshizawa1,2, Tsuneto Kanai1, Atsunori Sakurai1,2,3, Toshiki Sugimoto1,2,3 (1. National Institutes of Natural Sciences, Institute for Molecular Science, 2. SOKENDAI, 3. RIKEN HARIMA)
Surface activation by fast atomic beam bombardment enables direct bonding at room temperature without the use of adhesives. To elucidate the microscopic mechanism of this bonding process, we employed time-frequency domain hybrid coherent Raman spectroscopy to evaluate the structural composition of the amorphous layer formed on the activated surface of quartz. The time-resolved measurements allowed us to decompose overlapping vibrational bands, providing detailed compositional information within the amorphous layer. We found that the composition varied depending on the activation time. These results demonstrate that our spectroscopic approach is effective for evaluating amorphous surface structures in activated samples, and highlight the importance of microscopic structural characterization in both the standardization and further advancement of surface-activated bonding.