Presentation Information
[A-6-01 (Invited)]Milli-Kelvin Analysis Revealing the Role of Band-edge States in Cryogenic MOSFETs
〇Hiroshi Oka1, Hidehiro Asai1, Takumi Inaba1, Shunsuke Shitakata1, Hitoshi Yui1, Hiroshi Fuketa1, Shota Iizuka1, Kimihiko Kato1, Takashi Nakayama1, Takahiro Mori1 (1. National Institute of Advanced Industrial Science and Technology (AIST) (Japan))