Presentation Information
[A-6-04]A Correction Method of Split C-V Characteristics in MOSFETs by Using Transmission Line Model for Accurate Extraction of Effective Mobility
〇Zhao Jin1, Yutong Chen1, Xueyang Han1, Hiroshi Oka2, Takahiro Mori2, Kasidit Toprasertpong1, Mitsuru Takenaka1, Shinichi Takagi1 (1. The Univ. of Tokyo (Japan), 2. National Inst. of Advanced Indus. Sci. and Tech. (Japan))