Presentation Information
[B-8-02]Investigation of Endurance Characteristics of AFeFET: Electrical and Thermal Fatigue Phenomenon
〇Min Liao1, Xianzhou Shao1, Hao Xu1, Junshuai Chai1, Xiaoqing Sun1, Xiaoyu Ke1, Jinjuan Xiang2, Xiaolei Wang1, Wenwu Wang1 (1. Inst. of Microelectronics Chinese Academy of Sciences (China), 2. Beijing Superstring Academy of Memory Tech. (China))