[D-8] Processes and Characterization

4:00 PM - 4:15 PM JST(7:00 AM - 7:15 AM UTC)

[D-8-04] Dynamics of Hopping of Surface Trapped Electrons on GaN High Electron Mobility Transistors Observed by Operando X-ray Photoelectron Nanospectroscopy

Keiichi Omika¹, Yasunori Tateno², Tsuyoshi Kouchi², Naoka Nagamura³, Koji Horiba⁴, Masaharu Oshima⁵, Maki Suemitsu¹, 〇Hirokazu Fukidome¹ (1. Research Institute of Electrical Communication, Tohoku University (Japan), 2. Sumitomo Electric Industries, Ltd. (Japan), 3. National Institute for Materials Science (Japan), 4. Photon Factory, High Energy Accelerator Research Organization (Japan), 5. Institute for Solid State Physics, The University of Tokyo (Japan))

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