[K-1] Oxide-TFTs I

3:45 PM - 4:00 PM JST(6:45 AM - 7:00 AM UTC)Late News

[K-1-06 (Late News)] Theoretical Study on Structural and Electronic Properties of Interstitial Oxygen Defects in Amorphous Indium Gallium Oxide for Transistor Reliability

〇Chitra Pandy¹, Masaharu Kobayashi² (1. The University of Tokyo (Japan), 2. The University of Tokyo (Japan))

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