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Atomic-Scale Insights into the Effects of Biaxial Strain on the Electronic Structure of Orthorhombic Hf0.5Zr0.5O2

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01: Advanced CMOS: Material Science / Process Engineering / Device Technology

2024 International Conference on Solid State Devices and Materials

Presentation Information

[PS-01-16]Atomic-Scale Insights into the Effects of Biaxial Strain on the Electronic Structure of Orthorhombic Hf_0.5Zr_0.5O₂

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Presentation Information

[PS-01-16]Atomic-Scale Insights into the Effects of Biaxial Strain on the Electronic Structure of Orthorhombic Hf0.5Zr0.5O2

DOI:

Password required to view

[PS-01-16]Atomic-Scale Insights into the Effects of Biaxial Strain on the Electronic Structure of Orthorhombic Hf_0.5Zr_0.5O₂