[PS-03] 03: Heterogeneous and 3D Integration / Interconnect / MEMS

[PS-03-06] Precise Measurements of Small Reverse-Biased-Currents for Large-Barrier Au/Ni/n-GaN Schottky Contacts

〇Kenji Shiojima¹, Hiroki Imabayashi¹, Kentaro Kawanishi¹, Hiroshi Ohta², Tomoyoshi Mishima² (1. Univ. of Fukui (Japan), 2. Hosei Univ. (Japan))

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