[SO-PS-02] 02: Advanced and Emerging Memories / New Applications

1:54 PM - 1:56 PM JST(4:54 AM - 4:56 AM UTC)

[SO-PS-02-13] Investigation of Void Effect Inside Epi-plug on Electrical Characteristics of NAND Flash Memory

〇Dibyadrasta Sahoo¹, Ankit Gaurav¹, Mohd Ashraf Lone¹, Sanjeev kumar Manhas¹ (1. Indian Inst. of Tech. Roorkee (India))

Password required to view