[SO-PS-04] 04: Power / High‐speed Devices and Materials

1:30 PM - 1:32 PM JST(4:30 AM - 4:32 AM UTC)

[SO-PS-04-01] Unipolar AC Bias Stress Degradation Mechanism in Heterogeneous Ga₂O₃-on-SiC MOSFET

〇Chenyu Liu¹, Yibo Wang², Chunxiao Yu¹, Wenhui Xu³, Xiaole Jia¹, Shuqi Huang¹, Zeyu Yang¹, Xiaoxi Li⁴, Bochang Li⁴, Zhengdong Luo^1,4, Cizhe Fang⁴, Yan Liu¹, Tiangui You³, Xin Ou³, Yue Hao¹, Genquan Han^1,4 (1. School of Microelectronics, Xidian Univ. (China), 2. Suzhou Inst. of Nano-Tech and Nano-Bionics, Chinese Academy of Sci. (China), 3. Shanghai Inst. of Microsystem and Info. Tech., Chinese Academy of Sci. (China), 4. Hangzhou Inst. of Tech., Xidian Univ. (China))

Password required to view