2024 International Conference on Solid State Devices and Materials
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Sun. Sep 1, 2024
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2:04 PM - 2:06 PM JST
(5:04 AM - 5:06 AM UTC)
[SO-PS-04-18]
Analysis of Errors in Junction Temperature Estimated by Temperature-Sensitive Electrical Parameter for Parallel-Connected Power Devices
〇Shuhei Fukunaga
1
, Tsuyoshi Funaki
1
(1. Osaka University (Japan))
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