Presentation Information

[A-1-03]Recent insights in direct extraction of access resistance components in NSFET and CFET devices with the cascaded transistor method

〇PIERRE CHARLES EYBEN1, Andrea Pondini1,2, Hiroaki Arimura1, Thomas Chiarella1, Hans Mertens1, Clément Porret1, Erik Rosseel1, Ritam Sarkar1, Maryam Hosseini1, Daisy Zhou1, Jérome Mitard1, Naoto Horiguchi1 (1. IMEC (Belgium), 2. KU Leuven (Belgium))