Presentation Information

[A-1-04]Comparative Analysis of Conventional and Line-Type Tall Via Structures for CFET: Performance, Scalability, and Process Feasibility

〇Jimyoung Lee1,2, Seung Kyu Kim1,2, KwangYoung Lee1,2, Jongwook Jeon1 (1. Sungkyunkwan Univ. (Korea), 2. Samsung Electronics (Korea))