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[A-4-02]Anomalous Variability of Subthreshold Characteristicsin Bulk and SOI MOSFETs at a Cryogenic Temperature

〇Tomoko Mizutani1, Kiyoshi Takeuchi1, Takuya Saraya1, Takumi Inaba2, Hidehiro Asai2, Hiroshi Oka2, Takahiro Mori2, Masaharu Kobayashi1, Toshiro Hiramoto1 (1. The University of Tokyo (Japan), 2. AIST (Japan))

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