Presentation Information

[A-4-05]Evaluation of Transient Characteristics on Steep Subthreshold Slope “Gate-Controlled Carrier-Injection SOI-Transistor”

〇Haruki Yonezaki1,2, Takayuki Mori1, Jiro Ida1 (1. Kanazawa Inst. of Tech. (Japan), 2. KIOXIA Corp. (Japan))