[A-5] CFET Technology and Self-heating

9:30 AM - 9:45 AM JST(12:30 AM - 12:45 AM UTC)

[A-5-02] A Simulation Study of Single Event Upset in Nanosheet-based CFET SRAM

〇Vanness Filbert Cierra¹, Sida Wang¹, Yoshinari Kamakura¹ (1. Osaka Institute of Technology (Japan))