Presentation Information

[B-2-03]Physical Modeling of Oxide-Semiconductor-Channel FeFETs for Content Addressable Memory Circuit Simulation

〇Xuebin Wang1, Fei Mo1,2, Zhuo Li4, Guanhua Yang3, Masaharu Kobayashi4, Yeliang Wang1 (1. Beijing Inst of Tech. (China), 2. Beijing Inst of Tech.(Zhuhai) (China), 3. The Inst of Microelectronics of the Chinese Academy of Sci. (China), 4. The Univ. of Tokyo (Japan))