Presentation Information
[B-2-05]Fine-Grained Extraction Method of Discrete Shift and Spike RTN in 40nm TaOX-based Analog ReRAM for CiM Applications
〇Yushi Abarra1, Naoko Misawa1, Chihiro Matsui1, Ken Takeuchi1,2 (1. Department of Electrical Eng. and Info. Systems, The Univ. of Tokyo (Japan), 2. Systems Design Lab., Graduate School of Eng., The Univ. of Tokyo (Japan))