[H-2] Wide Bandgap and Oxide Materials I

4:15 PM - 4:30 PM JST(7:15 AM - 7:30 AM UTC)

[H-2-03] Multi-Scale Strain Landscape of Al_1-xGa_xN/GaN/Si Heterostructures Probed by X-ray Diffraction Microscopy

〇Cedric Xavier Corley-Wiciak¹, Pierre Everaere¹, Laura Neumann², Agnieszka Anna Corley-Wiciak¹, Ennio Tito Capria¹, Carsten Detlevs¹, Michael Reisinger³, Thu Nhi Tran Caliste¹, Tobias Urs Schulli¹ (1. European Synchrotron Radiation Facility (France), 2. Microelectronics and Nanoanalytic, Fraunhofer Institute for Ceramic Technologies and Systems (Germany), 3. Kompetenzzentrum Automobil- und Industrieelektronik GmbH (Austria))