Session Details

[H-2]Wide Bandgap and Oxide Materials I

Tue. Sep 16, 2025 3:30 PM - 4:45 PM JST
Tue. Sep 16, 2025 6:30 AM - 7:45 AM UTC
Room H (314, 3rd Floor)
Session Chair: Takuya Hoshi (NTT Device Technology Lab.), Yoriko Tominaga (Hiroshima Univ.)

[H-2-01 (Invited)]Recent Advances in ScAIN/GaN-based High Electron Mobility Transistors

〇Takuya Maeda1 (1. The Univ. of Tokyo (Japan))

[H-2-02]Machine Learning Prediction of Global Photonic Bandgaps in GaN Visible Topological PhCs with Triangular Holes

〇Hinaki Sugiura1, Akihiko Kikuchi1,2 (1. Sophia Univ. (Japan), 2. Sophia Semiconductor Research Inst. (Japan))

[H-2-03]Multi-Scale Strain Landscape of Al1-xGaxN/GaN/Si Heterostructures Probed by X-ray Diffraction Microscopy

〇Cedric Xavier Corley-Wiciak1, Pierre Everaere1, Laura Neumann2, Agnieszka Anna Corley-Wiciak1, Ennio Tito Capria1, Carsten Detlevs1, Michael Reisinger3, Thu Nhi Tran Caliste1, Tobias Urs Schulli1 (1. European Synchrotron Radiation Facility (France), 2. Microelectronics and Nanoanalytic, Fraunhofer Institute for Ceramic Technologies and Systems (Germany), 3. Kompetenzzentrum Automobil- und Industrieelektronik GmbH (Austria))

[H-2-04]Structures and Adsorption Behavior on N-polar GaN(000-1) Surface with Steps and Kinks: A First-Principles Study

〇Toru Akiyama1,2, Taiki Tahara1, Takahiro Kawamura1,2 (1. Graduate School of Engineering, Mie Univ. (Japan), 2. ICSDF, Mie Univ. (Japan))