[H-4] Characterization and Device Applications

11:15 AM - 11:45 AM JST(2:15 AM - 2:45 AM UTC)

[H-4-02 (Invited)] Challenges in Visualizing Buried Interfaces of Multi-Layered Thin-Film Structures for Applications: A Depth-Resolved and Spatiotemporal Big Data Analysis
Approach Based on Angle-Resolved XPS

〇Satoshi Toyoda¹ (1. Scienta Omicron (Japan))