Presentation Information

[J-1-03]Die-level 3D integration with Via-last TSV from Multi-Project Wafers Towards Universal Access to 3D-ICs

〇Akihiro Tominaga1, Jiayi Shen2, Tetsu Tanaka1,2, Takafumi Fukushima1,2 (1. Graduate School of Engineering, Tohoku Univ. (Japan), 2. Graduate School of Biomedical Engineering, Tohoku Univ. (Japan))