Presentation Information

[K-2-04]Determination of Critical Carrier Density in Re-doped WSe2 Crystal and Their Application to Esaki Diode

〇Toshinari Sugiyama1, Satoshi Morito2, Tomonori Nishimura1, Kaito Kanahashi1, Keiji Ueno2, Kenji Watanabe3, Takashi Taniguchi3, Kosuke Nagashio1 (1. The University of Tokyo (Japan), 2. Saitama University (Japan), 3. National Institute for Materials Science (NIMS) (Japan))