[K-2] Characterization I

4:45 PM - 5:00 PM JST(7:45 AM - 8:00 AM UTC)

[K-2-05] Probing Interface Trap Density and Mobility Scattering Mechanism in Monolayer MoS₂ Using Local-Back-Gate Transistors

〇Yuan-Chun Eric Su¹, Yi-Shuan Cheng¹, Sheng-Zai Liu¹, Jian-Chen Tsai¹, Jing-Kai Jiang¹, Wen-Hao Chang^1,2,3 (1. National Yang Ming Chiao Tung University (Taiwan), 2. Academia Sinica (Taiwan), 3. Center for Emergent Functional Matter Science (Taiwan))