[K-4] Characterization II

11:15 AM - 11:30 AM JST(2:15 AM - 2:30 AM UTC)

[K-4-03] Quantitative ToF-SIMS analysis of Transferred Nb Doped MoS₂:
Direct Dopant Quantification and Micrometer Scale Impurity Distribution

〇Itsuki Tanaka¹, Tomonori Nishimura¹, Kaito Kanahashi¹, Satoru Morito², Keiji Ueno², Kosuke Nagashio¹ (1. The Univ. of Tokyo (Japan), 2. Saitama Univ. (Japan))

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