Presentation Information
[M-7-03]Revealing Characteristics under Gate Scaling to Achieve High RF Performance with Small-Signal Analysis in InAlGaN/GaN HEMTs
〇Yi-Lun Huang1, Kun-Yang Jhang2, Min-Chun Chung2, Ren-Hong Zhang2, Chao-Hsin Wu1,2,3 (1. Graduate School of Advanced Tech., National Taiwan Univ. (Taiwan), 2. Graduate Inst. of Photonics and Optoelectronics, National Taiwan Univ. (Taiwan), 3. Graduate Inst. of Electronics Engineering, National Taiwan Univ. (Taiwan))