Presentation Information

[SO-PS-02-05]Erasing by Hot Hole Injection in eSTMTM device: Comprehension & Optimization

〇Celine Belabbas1, Vincenzo Della Marca1, Pierre Canet1, Marc Mantelli2, Thibault Kempf2, Arnaud Regnier2, Stephan Niel3, Francesco La Rosa2 (1. Aix-Marseille Univ., Toulon Univ., CNRS, IM2NP, Marseille (France), 2. STMicroelectronics, Rousset (France), 3. STMicroelectronics, Crolles (France))