[SO-PS-02] 02: Advanced and Emerging Memories / New Applications

1:58 PM - 2:00 PM JST(4:58 AM - 5:00 AM UTC)

[SO-PS-02-15] Comparative Evaluation of Recovery Schemes for Hafnium-Based Ferroelectric Capacitors

〇Man Yutai¹, Du Peiyuan^1,2, Liu Huan^1,2, Yu Fei^1,2, Li Dongya^1,2, Zhang Hongrui¹, Chen Bing^1,2, Cheng Ran³, Ke Mengnan⁴, Liu Yan², Yu Xiao^1,2, Han Genquan^1,2 (1. Hangzhou Institute of Technology, Xidian University (China), 2. School of Microelectronics, Xidian University (China), 3. College of Integrated Circuits, Zhejiang University (China), 4. Institute for Multidisciplinary Sciences, Yokohama National University (Japan))